Installation Testing Reports

The Next Frontier for Virtualization: Over-Utilized Systems: Identifying and eliminating the most critical and costly constraints from the enterprise software development and testing lifecycle
sponsored by iTKO LISA
WHITE PAPER: This article explains the utilization patterns in enterprise IT environments, and which type of Virtualization (Hardware or Service virtualization or both) should be applied to receive the greatest value. This paper discusses how to apply the principle of under and over-utilization to apply the right type of virtualization for business needs.
Posted: 20 Oct 2010 | Published: 20 Oct 2010

iTKO LISA

Strategies for Lowering the Cost of Manufacturing Test
sponsored by National Instruments
WHITE PAPER: NI platform offers high test throughput, increased productivity, and a lower cost of ownership than traditional disjoint systems or turnkey solutions based on proprietary architectures.
Posted: 02 Sep 2002 | Published: 01 May 2001

National Instruments

RMIT University delivers a positive student experience with HP
sponsored by Hewlett Packard Enterprise
CASE STUDY: RMIT University, one of Australia's leading educational institutions, was struggling with a poor-performing student portal and website. In this brief case study, find out how RMIT implemented a performance testing platform to predict future system behavior, improve application performance, and optimize future student-critical app delivery.
Posted: 24 Jun 2013 | Published: 31 Aug 2011

Hewlett Packard Enterprise

Testing Residential Cabling Systems
sponsored by Fluke Networks
APPLICATION NOTE: In commercial cabling, standards are well established for the testing and certification of structured wiring systems.
Posted: 28 Mar 2004 | Published: 01 Jan 2002

Fluke Networks

Softbank Mobile Overhauls its System Testing and Transforms Delivery of New Products
sponsored by Hewlett Packard Enterprise
CASE STUDY: Check out this brief case study to see how Softbank Mobile Corporation, one of Japan's leading mobile telecommunications providers, implemented a new system test standardization to ensure top-notch quality of all their business-critical applications and systems, at a fast pace and low cost.
Posted: 25 Jun 2013 | Published: 30 Sep 2012

Hewlett Packard Enterprise

Lowering the Cost of Test with Integrated Switch Management
sponsored by National Instruments
WHITE PAPER: National Instruments Switch Executive is a significant innovation in the design and implementation of automated test systems.
Posted: 02 Sep 2002 | Published: 01 Feb 2002

National Instruments

Solitaire Interglobal: Comparing Virtualization Methods for Business - Executive Summary
sponsored by IBM.
WHITE PAPER: Access this resource for a deep dive analysis of the business differentiators among x86, UNIX, and System z virtualization technologies to help you determine the right path for your data center.
Posted: 21 May 2013 | Published: 22 May 2012

IBM.

Rapid Bottleneck Identification - A Better Way to do Load Testing
sponsored by Oracle Corporation
WHITE PAPER: Rapid bottleneck identification (RBI) is a new testing methodology that allows quality assurance (QA) professionals to very quickly uncover Web application performance limitations and determine the impact of those limitations on the end user experience.
Posted: 12 Oct 2009 | Published: 01 Jun 2009

Oracle Corporation

Intel® Xeon® Processor 7300 Series
sponsored by Intel Corporation
PRODUCT OVERVIEW: Based on the Intel® Core™ microarchitecture, the Intel Xeon processor 7300 series offers leading scalable performance and best-in-class virtualization for server consolidation.
Posted: 21 Nov 2007 | Published: 01 Nov 2007

Intel Corporation

National Instruments Synchronization and Memory Core - A Modern Architecture for Mixed Signal Test
sponsored by National Instruments
WHITE PAPER: By providing a common architecture for the 100 MS/s mixed-signal prototyping a test suite of instruments, the SMC enables the instruments to test systems where digital and analog signals are side by side.
Posted: 28 Aug 2003 | Published: 01 Jul 2003

National Instruments