Tests White Papers

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IEEE 1149.1 Use in Design for Verification and Testability at Texas Instruments
sponsored by Texas Instruments, Inc.
WHITE PAPER: This document introduces those products that include ASIC cells, standard interface ICs, a bus master IC, a controller interface board for IBM compatibles, a high-speed scan interface, and software to control the scan bus.
Posted: 17 Mar 2002 | Published: 05 May 2000

Texas Instruments, Inc.

Introducing WebLogic Server 12c: The #1 Application Server Across Conventional and Cloud Environments
sponsored by Oracle India Pvt. Ltd
WHITE PAPER: This informative white paper analyses how application servers can provide runtime capabilities like reliability, availability, scalability, security, user management, performance, virtualization, and more. And also provide tools for developing, testing, and deploying applications.
Posted: 31 May 2013 | Published: 31 Jan 2012

Oracle India Pvt. Ltd

Cloud Computing: Save Time, Money, and Resources with a Private Test Cloud
sponsored by IBM
WHITE PAPER: Cloud computing can help you organize and streamline your test environment. The business model of cloud computing facilitates better use of existing resources, allowing you to do more with fewer resources. As a result, you can achieve a highly simplified and so much more.
Posted: 20 Oct 2010 | Published: 19 Oct 2010

IBM

Built-in Self-test (BIST) Using Boundary Scan
sponsored by Texas Instruments, Inc.
WHITE PAPER: This document shows how existing architectures can be modified to conform to IEEE 1149.1 architecture.
Posted: 09 May 2000 | Published: 01 Dec 1996

Texas Instruments, Inc.

Solution Brief: IBM InfoSphere Optim Test Data Management Solution for SAP Applications
sponsored by IBM
WHITE PAPER: InfoSphere Optim Test Data Management Solution for SAP Applications creates targeted, right-sized development, testing and training environments, reducing the time, expense and manual effort. This solution brief provides an overview of the product.
Posted: 06 Apr 2011 | Published: 06 Apr 2011

IBM

6 Tips to Get Started with Automated Testing
sponsored by SmartBear Software
WHITE PAPER: Automated testing will shorten your development cycles, avoid cumbersome repetitive tasks and help improve software quality but how do you get started? The best practices discussed in this white paper help ensure results and a successful foundation for improving your software quality.
Posted: 14 Sep 2010 | Published: 14 Sep 2010

SmartBear Software

Design-for-Test Analysis of a Buffered SDRAM DIMM
sponsored by Texas Instruments, Inc.
WHITE PAPER: This document presents a design-for-test analysis of a buffered synchronous dynamic random access memory dual in-line memory module.
Posted: 11 Mar 2002 | Published: 13 Aug 1996

Texas Instruments, Inc.

Advanced RFID Measurements: Basic Theory to Protocol Conformance Test
sponsored by National Instruments
WHITE PAPER: As RFID adoption continues to grow, engineers are faced with an increasing need to validate tags both for interoperability with products from other vendors and for conformance with the specified protocol.
Posted: 21 Jul 2008 | Published: 01 Jan 2006

National Instruments

Integrate Rational ALM applications with SAP Solution Manager
sponsored by IBM
WHITE PAPER: To support effective collaboration, IT teams need to unify and expedite the delivery of SAP and other critical business systems. In this resource, learn how to leverage an ALM platform and other tools that help your respond to the difficulty of managing change in SAP environments quickly and without breaking the bank.
Posted: 09 Aug 2013 | Published: 31 Dec 2012

IBM

Success with Static Analysis for Security: Why Code Audits Fail
sponsored by Parasoft Corporation
WHITE PAPER: This paper explains why and how to apply static analysis tools in the context of a policy-based security process that not only prevents security vulnerabilities, but also focuses on SDLC productivity.
Posted: 01 Apr 2009 | Published: 01 Apr 2009

Parasoft Corporation